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The-MAP with UEI DAQ

Simmulation of The-MAP with UEI DAQ (The-MAP : PFK's self-developmented TC-wafer temperature monitoring system)   DAQ by UEI(United Electronic Industry) UEI DAQ has 3 slot,  Each slot can connected with 12channel module, UEI DAQ can handle 36 channels totally.   Main interface of The-MAP

Gard Eye(loading area monitor system)

 

<Gard eye>

- Machine Inside Monitoring System 
Developed and manufactured by PFK -

<History of Development>

Engineers wished to improve the CCTV camera 

inside diffusion tool as wafers occasionally broke

However it was challenging due to extemely 

high temperature around loading area

After long experiments,

PFK finally developed the camera 

which can withstand the high temperature



8 HD Cameras with 1 controller system with software

16 Cameras and 16 Led light with 
1 controller system with software

Gard eye Monitors wafer loading area and stores in a file

it can withstands high temperature environment

Prevents from accidents can occur at 
diffusion tool wafer loading area

Gard eye Monitor and store data in a file for 30 days


pfk semiconductor, instruments, equipments

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